Microscopes and ancillary equipment
Details of microscopes and ancillary equipment at the Facility for Electron Microscopy.
| Microscope |
Worktribe facility number |
Electron source |
Analytics-EDS |
Analytics-EBSD |
Analytics-WDS |
|
539 |
Tungsten Filament |
Oxford Instruments-SwiftID |
|
|
| SEM-Jeol JSM-6060 |
540 |
Tungsten Filament |
Oxford Instruments-Inca Xact |
|
|
|
541 |
LaB6 tip |
Oxford Instruments-Inca Xact |
|
|
|
542 |
LaB6 tip |
Bruker-Quantax Esprit-X Flash 6I60 |
Bruker-Quantax Esprit-E Flash FS |
|
| SEM-Jeol JSM-7000F |
543 |
Field emission gun (FEG) |
Oxford Instruments-Aztec-UltimMax |
Oxford Instruments-Aztec Nordlys |
Oxford Instruments-Inca Wave |
| SEM-FEI FIB Quanta 3D |
544 |
Field emission gun (FEG) |
Oxford Instruments-Inca Xact |
Oxford Instruments-HKL Nordlys |
|
|
545 |
Field emission gun (FEG) |
Thermo Fisher Scientific-ColorSEM UltraDry |
|
|
| TEM-Jeol JEM-1400 |
546 |
Tungsten Filament |
|
|
|
| TEM-Jeol JEM-2100 |
547 |
LaB6 tip |
|
|
|
| TEM-Philips Tecnai F20 |
548 |
Field emission gun (FEG) |
Oxford Instruments-Aztec Xmax |
|
|
|
626 |
Field emission gun (FEG) |
|
|
|
|
627 |
Tungsten Filament |
|
|
|
|
628 |
N/A |
|
|
|
|
TBC |
N/A |
|
|
|
| |
|
|
|
|
|